then no longer periodic and can exhibit a very broad range of thicknesses ranging from a few nanometers to a few hundreds of nanometer for filers in visible and near-IR range.
To precisely control the thickness of each layer, there are, as of today, two classes of optical monitoring techniques: monochromatic and broadband optical monitoring. The first one relies on an in-situ measurement of the transmitted (or reflected) intensity at a single wavelength and, in this case, the choice of the proper wavelength is a critical criterion that will affect the precision of the control. The second one relies on an in-situ measurement of the transmitted (or reflected) intensity over a broad spectral range and, in this case, the choice of the proper stopping condition is a critical criterion that will affect the precision of the control.
In this thesis, we propose to explore broadband optical monitoring techniques. These developments will be done in collaboration between the Thin Film Research Team at institut Fresnel in Marseille, France (https://www.fresnel.fr/spip/spip.php?article1487) and Bühler company (R&D department of Bühler/Leybold Optics in Alzenau, Germany (https://www.buhlergroup.com/global/en/process-technologies/high-vacuum-thin-film-coating/about-buehler-leybold-optics.htm).
The candidate is then expected to spend most of his time at institut Fresnel with some shorts stays at Bühler and at the other TRADES partners sites. The candidate must have a Master in Science with good knowledge in optics, programming and if possible in optical thin films.
Where to apply
E-mail: julien.lumeau@fresnel.fr
Requirements
- Research Field: Physics » Optics
- Education Level: Master Degree or equivalent
- Skills/Qualifications: Optics, Photonics, Programming
- Languages: ENGLISH
- Level: Excellent
- Years of Research Experience: None
Work Location(s)
- Number of offers available: 1
- Company/Institute: Institut Fresnel
- Country: France
- City: Marseille
- Postal Code: 13013
- Street: Du Saint Jerôme
